A software platform for ISFET simulation based on open source tools to fit model parameters

Luighi Viton-Zorrilla, Jinmi Lezama

Resultado de la investigación: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

This paper presents a software platform based on open source tools to simulate and fit parameter values of sensor device models based on MOSFET like the ISFET. In electronic simulation, electrical and mathematical models allow to describe the behavior of electronic devices. Although manufacturers provide device models, in some cases, this information is not enough to simulate their characteristics. In order to improve the parameter values of mathematical model, the fitting procedure compares the measured and simulated data. This platform allows testing different models such as ISFET or MOSFET using freely available SPICE simulator engines. It constructs the netlist based on the classical ISFET behavioral macromodel considering the values entered by the user, then via a set of methods simulate this customized model for both characteristics curves iDS vs vGS and iDS vs vDS and compare them with experimental results obtained from a characterization process.

Idioma originalInglés
Título de la publicación alojadaProceedings of the 2019 IEEE 26th International Conference on Electronics, Electrical Engineering and Computing, INTERCON 2019
EditorialInstitute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)9781728136462
DOI
EstadoPublicada - ago. 2019
Publicado de forma externa
Evento26th IEEE International Conference on Electronics, Electrical Engineering and Computing, INTERCON 2019 - Lima, Perú
Duración: 12 ago. 201914 ago. 2019

Serie de la publicación

NombreProceedings of the 2019 IEEE 26th International Conference on Electronics, Electrical Engineering and Computing, INTERCON 2019

Conferencia

Conferencia26th IEEE International Conference on Electronics, Electrical Engineering and Computing, INTERCON 2019
País/TerritorioPerú
CiudadLima
Período12/08/1914/08/19

Nota bibliográfica

Publisher Copyright:
© 2019 IEEE.

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